TY  - GEN
AU  - Rao, C Radhakrishna
TI  - Advanced Statistical Methods in Biometric Research
U1  - 570.15195 
PY  - 1952///
CY  - New York
PB  - John Wiley & Sons, Inc.
KW  - Biometric Research
KW  - Statistical Biometrics
ER  -